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Sensor Node Failure Detection based on Round Trip Delay and Paths in WSN's


Shivaraj S Kalburgi , walchand institute of technology, solapur


Faulty sensor node, round trip delay, round trip paths, WSNs


In recent years, applications of wireless sensor networks (WSNs) have been increased due to its connection between the physical world to the virtual world. The cost of the wireless sensor nodes have been reduced because of the advancements in the microelectronics manufacturing technology. It is the need to deploy more number of nodes in the network to assure the better quality. The failed node in the network is a huge problem as it affects the operation of entire network. As the number of nodes increases in the network, there is an increase in probability of failed nodes. It is essential to detect such nodes and take corrective measures. In the proposed method, faulty sensor node is detected by measuring the round trip delay (RTD) time of discrete round trip paths and comparing them with threshold value.

Other Details

Paper ID: IJSRDV4I50505
Published in: Volume : 4, Issue : 5
Publication Date: 01/08/2016
Page(s): 896-899

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