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Residual Stress Measurement using X-Ray Diffraction for Weldments

Author(s):

Harinadh Vemanaboina , Nalla Narasimha Reddy Education Society’s Group of Instititions, Hyderabad, Telangana State, India; D.Anil Kumar, Nalla Narasimha Reddy Education Society’s Group of Instititions, Hyderabad, Telangana State, India; B.Dinesh Kumar, Nalla Narasimha Reddy Education Society’s Group of Instititions, Hyderabad, Telangana State, India; K.Sreekanth, Nalla Narasimha Reddy Education Society’s Group of Instititions, Hyderabad, Telangana State, India; L.Suresh Nayak, Nalla Narasimha Reddy Education Society’s Group of Instititions, Hyderabad, Telangana State, India

Keywords:

TIG, Residual Stress, X-Ray Diffraction

Abstract

This Guide is applicable to X- ray stress measurements on crystalline materials. There is currently no published standard for the measurement of residual stress by XRD. This Guide has been developed therefore as a source of information and advice on the technique. It is based on results from three UK inter-comparison exercises, detailed parameter investigations and discussions and input from XRD experts. The information is presented in separate sections which discuss the fundamental background of X-ray diffraction techniques, the different types of equipment that can be used, practical issues relating to the specimen, the measurement procedure itself and recommendations on how and what to record and report. The appendices provide further information on uncertainty evaluation and some recommendations regarding the data analysis techniques that are available. Where appropriate key points are highlighted in the text and summarized at the end of the document.

Other Details

Paper ID: RTIMEP030
Published in: Conference 7 : RTIME-2k16
Publication Date: 01/05/2016
Page(s): 176-179

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