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REDUCING LAUNCH AND CAPTURE POWER USING SABOTEUR AND MUTANTS METHOD

Author(s):

Jonisha Stanis.S , kALAIGNAR kARUNANIDHI INSTITUTE OF TECHNOLOGY; Maria Antony.S, KALAIGNAR kARUNANIDHI INSTITUTE OF TECHNOLOGY

Keywords:

Launch Off Capture (LOC), Launch off Shift (LOS), Automatic Test Pattern Generation (ATPG), Linear Feedback Shift Register (LFSR)

Abstract

Testing of VLSI circuit aims for high quality screening of the circuits by targeting on performance related faults. Excessive switching in launch and capture operation results in high yield loss. Power management is also a major issue in VLSI design technique. Scan chain reordering method is used to reduce the number of transitions and thus the power consumption gets reduced. Fault injection technique based on the use of hardware description language offer important advantages than other techniques. Saboteurs and mutants methods were important fault injection techniques. By which the number of test pattern generation can be reduced and thus the time for processing was also gets reduced. As this type of technique can be applied during the design phase of the system, which reduces the time-to-market. They provide high controllability and reachability. This technique improves the fault coverage and reduces pattern count. The proposed algorithm is coded in VHDL and simulated using ModelSim and Xilinx ISE 8.1isimulator. The results obtained are compared with the existing version of the technique.

Other Details

Paper ID: IJSRDV3I1045
Published in: Volume : 3, Issue : 1
Publication Date: 01/04/2015
Page(s): 1511-1515

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