Reliability of Led Driver Circuit and Its Analysis |
Author(s): |
| CHETAN D UPADHYAY , L.D COLLEGE OF ENGINEERING; LUHAR DHIRENKUMAR ARJUNBHAI, L.D COLLEGE OF ENGINEERING; PATEL KRUNAL HASHMUKBHAI, L.D COLLEGE OF ENGINEERING |
Keywords: |
| LED Driver Circuit, LED Driver Analysis |
Abstract |
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Recently LED is best option for domestic as well as commercial lighting applications. But in LED lighting driver circuit is very weak link. Reliability study of LED driver is one of the most challenging and time consuming process. This paper proposes temperature effect test and voltage stress method to predict reliable life of LED driver circuit and entire LED system. In typical applications this systems are subjected to high temperature as they are usually placed in open environment. For accelerated life time test, effect of temperature on electrolytic capacitor is considered and for voltage stress method knee-point voltage is important parameter. This paper also proposes life estimation method to predict life of LED driver circuit. Also, experimental procedures as well as results are presented for both method. |
Other Details |
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Paper ID: IJSRDV4I30831 Published in: Volume : 4, Issue : 3 Publication Date: 01/06/2016 Page(s): 796-800 |
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