Implementation of an Algorithms for Improve the Quality of Memory Built-In Self-Test Tools |
Author(s): |
| C Gangaiah Yadav , NOORUL ISLAM UNIVERSITY; Dr. K. S. Vijula Grace, NOORUL ISLAM UNIVERSITY |
Keywords: |
| MBIST, TMB Validator, user-defined algorithms (UDA), Memory Fault Simulator, Controller Emulation, Fault Coverage |
Abstract |
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In the paper, presented the two techniques ensuring the high quality of the memory built-in self-test. The described ideas illustrate general methods and are applicable to any commercial memory BIST tool. The first approach describes controller emulation in order to validate each step of the real controller’s operations. The second solution presents a way to determine the test algorithms’ fault coverage by means of the memory fault simulator. The experimental results shows functional benefits and effectiveness of the proposed methods. |
Other Details |
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Paper ID: IJSRDV5I20955 Published in: Volume : 5, Issue : 2 Publication Date: 01/05/2017 Page(s): 1840-1844 |
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