Design and Simulation of 16 bit Regenerative Serial In Serial Out Shift Register |
Author(s): |
| Abin Satheesan , Bannari Amman Institute of Technology; Rehna Vincent, Bannari Amman Institute of Technology; Vivitadurga R, Bannari Amman Institute of Technology |
Keywords: |
| SISO, LIFO, Baud Rate, Recovery Time |
Abstract |
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Data movement has the very significant role in the data communication and processing in digital and analog systems. It is not easy as well as not simply the movement of digital data streams through the semiconductor chips during the processing and communicating time with a neighbor system. This technique provides a simple and easy method to move the digital data through the different communicating modules with a high degree of reliability and data recovery. |
Other Details |
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Paper ID: IJSRDV6I80015 Published in: Volume : 6, Issue : 8 Publication Date: 01/11/2018 Page(s): 20-22 |
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